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Aystorm Scientific Ltd. (Popularity:  )
http://www.aystorm.com
Materials characterisation & surface analysis services. Specialising in ion beam analysis including SIMS, ule SIMS, Auger, XPS, RBS, TEM and surface contamination (TOF SIMS, VPD-TXRF, VPD-ICPMS). Consultancy in various aspects of thin films and nano layers ...
Category:
Science - Technology - Metrology - Products and Services
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